Beilstein J. Nanotechnol.2019,10, 1636–1647, doi:10.3762/bjnano.10.159
calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defectdetection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.
Keywords: atomic
force microscopy (AFM); contact resonance atomic force microscopy (CR-AFM); contact stiffness; defectdetection; flexible circuits; subsurface imaging; Introduction
With the rapid shrinkage of microelectronic devices, flexible circuits are intensively used while being functionalized as supercapacitors
the experimental settings.
Defectdetection
To further demonstrate the capability of CR-AFM for imaging tiny subsurface defects in the embedded circuit pattern, we carried out CR-AFM imaging experiments on a specimen which contains well-defined defects with different dimensions. Those defects were
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Figure 1:
(a) Schematic illustration of CR-AFM imaging on the flexible circuit sample. (b) An enlarged sectio...